Pogo Pin PAL50-B1

The PAL50-B1 is a spring-loaded test probe designed for temporary electrical contact during PCB and electronic circuit testing. Its B1 spear-shaped tip is suitable for contacting solder joints and PCB test pads, including surfaces where a pointed contact helps establish a reliable connection. It is commonly used in automatic in-circuit testing fixtures.

Specifications

Applications

• ICT (In-Circuit Testing)
• PCB electrical testing
• PCB test fixtures and jigs
• Solder-joint contact testing
• Continuity testing
• Electronics production testing
• Automated testing fixtures
• Circuit-board inspection