SKU code: #IMT00810
Category Name: SMT Spare
₹4,000
You save ₹400(10% off)
Inclusive of all taxes
₹4,000
You save ₹400(10% off)
Inclusive of all taxes
Estimate delivery times: 5-7 days .
The PAL50-H2 is a spring-loaded test probe designed for reliable temporary electrical contact in PCB and electronic circuit testing. Its H2 multi-point/crown-style tip helps make stable contact with pads, solder points, terminals, and component leads in test fixtures. It is commonly used in ICT, FCT, continuity testing, programming jigs, and automated production testing.
| Parameter | Specification |
|---|---|
| Product Name | Pogo Pin / Spring Test Probe |
| Model | PAL50-H2 |
| Probe Type | Multi-Point / Crown-Type Test Probe |
| Product Series | PAL50 Series |
| Tip Type | H2 Crown / Multi-Point Tip |
| Function | Temporary Electrical Contact |
| Surface Finish | Gold Plated |
| Application | PCB & Electronic Circuit Testing |
| Suitable For | ICT, FCT & Test Fixtures |
| Usage | Production Testing, Programming & Continuity Testing |
₹4,000
You save ₹400(10% off)
Inclusive of all taxes
Estimate delivery times: 5-7 days .